G.N.R. Analytical Instruments Group diseña y produce Difractómetros de Rayos-X portables y de laboratorio (XRD), así como Espectrómetros de Fluorescencia de Rayos-X (XRF) para el estudio de
estructuras y composición de diferentes materiales.
DIFRACTÓMETROS DE RAYOS-X GNR:
APD 2000 PRO
Europe 600 is a benchtop - Theta/2Theta - general purpose diffractometer for XRD qualitative and quantitative analysis of polycrystalline materials.
Its compact size and robust design enables installation and operations in a small space and low cost of ownership and
Thanks to the wide offer of configurations and accessories, such as high speed detector, scintillation counter, secondary
monochromator, spinner and multiple sample holder, Europe 600 is the perfect instrument for fast-paced routine industrial quality assurance analysis and for teaching XRD at academic
Europe operating at 600 watts enables faster analysis and oustanding overall results.
APD 2000 PRO diffractometer is an high
power - Theta/2Theta - laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of
Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humiduty chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.
APD 2000 PRO Key Features
EXPLORER is a multi purpose - Theta/Theta - high resolution diffractometer which, thanks to
its direct drive torque motors, offers top performances in many analytical areas, from phase analysis to determination of microstructural properties on bulk or thin film
Thanks to its modularity and the wide range of accessories and attachments available, EXPLORER allows to perform measurement in different configurations: traditional X-Ray Powder Diffraction (XPD), Reflectometry (XRR), Grazing Incidence X-Ray Diffraction (GIXRD), High Resolution X-Ray Diffraction (HRXRD), Total X-Ray Fluorescence (TXRF), Residual Stress and Texture X-Ray Diffraction.
The modularity and the flexibility of the GNR X-Ray Explorer allows to start with an entry-level system which can be upgraded to meet new requirements. GNR could supply a wide range of X-ray sources, optics, sample holders, detectors and configurations to satisfy all the analytical needs.
With no limits to its applications, Explorer modular system offers high performances in all analytical areas, ranging from phases quantification of mixtures, to the determination of microstructural properties as residual stress and preferred orientation of crystallites on bulk materials as well as on thin films.
The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.
The high resolution reflectometry studies can be performed with EXPLORER to characterise layer thickness (from 1 to 500 nm with an accuracy better than 1%), density (with an accuracy better than ± 0.03 g/cm3), surface and interface roughness (from 0 to 5 nm with an accuracy better than ± 0.1 nm).
Measurements at low angles and a thin film attachment for parallel beam geometry allow the study of thin films and multilayers.
The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.